eo_logo
 
Product added to cart
TECHSPEC® components are designed, specified, or manufactured by Edmund Optics. TECHSPEC® components are designed, specified, or manufactured by Edmund Optics. Learn More

12.5 x 17.68 x 3mm NIR, Elliptical Plate Beamsplitter

Elliptical Plate Beamsplitters

×
Stock #47-167 Clearance 3-4 days
×
Quantity Selector - Use the plus and minus buttons to adjust the quantity. +
€34,95
Qty 1+
€34,95
Volume Pricing
Request Quote
Prices shown are exclusive of VAT/local taxes
Get Product Downloads
Clear Aperture (%):
>80
Coating:
NIR
Coating Specification:
Surface 1: 50R/50T (Rabs ±5% @ 900nm, Ravg ±10% @ 700 - 1100nm)
Surface 2: Ravg ≤1.0%, Rabs ≤2.0% @ 700 - 1100nm
Construction:
Plate
Edges:
Cut with 0.25mm Maximum Edge Chip
Major Axis (mm):
18.68 +0.0/-0.40 (physical length)
Minor Axis (mm):
12.50 +0.0/-0.10
Parallelism (arcmin):
<1
Reflection/Transmission Ratio (R/T):
50/50
Substrate: Many glass manufacturers offer the same material characteristics under different trade names. Learn More
Surface Flatness (P-V):
<2λ (per inch)
Surface Quality:
60-40
Thickness (mm):
3.00
Thickness Tolerance (mm):
±0.1
Type:
Standard Beamsplitter
Wavelength Range (nm):
700 - 1100

Regulatory Compliance

RoHS 2015:
Reach 224:
Certificate of Conformance:

Product Family Description

  • Circular Profile at 45°
  • Visible and NIR Coating Options Offered
  • Ideal for Diffuse Axial and In-line Illumination

TECHSPEC® Elliptical Plate Beamsplitters maximize beamsplitting efficiency while minimizing required mounting space. These beamsplitters are ideal for diffuse axial and in-line illumination. When oriented at 45°, the beamsplitters create a circular aperture equal to the diameter of the minor axis. TECHSPEC® Elliptical Plate Beamsplitters are available with either a visible or NIR 50% reflection/50% transmission beamsplitter coating and feature a high efficiency multi-layer anti-reflection (AR) coating to reduce back reflections. The beamsplitters are offered in either a 1 or 3mm thickness, in a range of major and minor axis measurements and wavelength ranges.