Long Working Distances to Reduce Risk of Specimen Damage
Correction Collars to Adjust for Specimen Thickness
Ideal for Silicon Wafer Inspection
Olympus Plan Achromatic Near-Infrared Objectives provide high transmission between 700 - 1600nm, making them an excellent choice for near-infrared microscopy when coupled with an NIR tube lens. These objectives feature long working distances to reduce the risk of damage to specimens and support up to field number 22 for observation. Magnifications of 20X and higher feature a correction collar to correct for aberrations based on the thickness of either the glass or silicon substrate being inspected. Olympus Plan Achromatic Near-Infrared Objectives are ideal for use in silicon wafer inspection to view the internal structure for defects.
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