Edmund Optics^®

Modular accessories adapt the Spectrolight Mighty Light Illuminator for tuning to a specific wavelength, fiber coupling, collimating, homogenizing, and more

Discover the different types of testing targets and their ideal applications, advantages, limitations, equations, and examples at Edmund Optics.

Join us for a discussion about the equipment and techniques needed to properly align optical assemblies and verify their key performance requirements.

Join us for a discussion about the equipment and techniques needed to properly align optical assemblies and verify their key performance requirements.

Shack-Hartmann wavefront sensors are used to test the transmitted wavefront error of laser beam expanders, predicting the real-world performance of the beam expander.

Learn how to assemble and align a Michelson Interferometer using standard lab components from Edmund Optics. This step-by-step guide covers required parts, setup instructions, and alignment tips for producing interference fringes to measure distance, wavelength, or refractive index changes in an accessible lab environment.

Are you designing an optical system? Be sure to review these 5 considerations relating to mechanical design, assembly, and alignment at Edmund Optics.

Laser Induced Damage Threshold describes the maximum quantity of laser radiation an optic can take before damaging. Learn more at Edmund Optics.

Join our discussion around laser damage testing in the third episode of our LIGHT TALKS series.

Many challenges can arise when aligning a laser beam; knowing specific tips and tricks can help simplify the process. Learn more at Edmund Optics.

Testing laser induced damage threshold (LIDT) is not standardized, so understanding how your optics were tested is critical for predicting performance.

Optimizing your imaging system means more than just choosing the right camera. Selecting the correct camera accessories ensures optimum performance, system stability, and successful integration. This application note explains power requirements for the two most common camera interfaces, USB and GigE, details the essential and optional accessories that enable reliable power delivery, and gives expert tips for selecting the most suitable components for your imaging system.

Advances in microscopy, imaging, and extreme ultraviolet optics

Computer Generated Hologram metrology provides a new solution for overcoming traditional asphere metrology. Learn more about CGH metrology at Edmund Optics.