eo_logo
 
Product added to cart
All Products / Microscopy / Infinity Corrected Objectives / Olympus WLI Infinity Corrected Interferometry Objectives
See all 6 Products in Family

Olympus 10X WLI Objective

See More by Olympus

×
Stock #91-172 New 2 In Stock
Quantity Selector - Use the plus and minus buttons to adjust the quantity. +
€4.560,00
Volume Pricing
Qty 1+ €4.560,00 each
Need More? Request Quote
Prices shown are exclusive of VAT/local taxes
Product Downloads

Specifications

General

Model Number:
WLI10XMRTC
Compatible Tube Lens Focal Length (mm):
Focal Length: 180mm
Type:
Microscope Objective
Style:
Infinity Corrected
Manufacturer:
Olympus
Note:
Designed to be used with a 180mm Tube Lens, Sold Separately

Physical & Mechanical Properties

Field of View (mm):
2.2
Length excluding Threads (mm):
36.80
Maximum Diameter (mm):
29.7

Optical Properties

Focal Length FL (mm):
18.00
Magnification:
10X
Numerical Aperture NA:
0.3
Resolving Power (μm):
1.12
Depth of Field (μm):
3.06
Working Distance (mm):
8.2
Field Number (mm):
22
Parfocal Length (mm):
45
Depth of Focus (μm):
305.6

Threading & Mounting

Mounting Threads:
RMS / 20.32mm x 36 TPI

Regulatory Compliance

RoHS 2015:
Exempt
×
Certificate of Conformance:
View
×

Product Details

  • Combines High Numerical Aperture and Broad Field of View
  • Thermal Compensation & Stability Features
  • Suitable for 3D Surface Metrology and Profilometry

Olympus WLI Infinity Corrected Interferometry Objectives' advanced optical design combines a high numerical aperture with a broad field of view, capturing fine surface details across large areas for visual clarity. Each objective features a built-in adjustment ring that compensates for temperature-induced focused shifts, allowing stability and consistent measurement accuracy even under unstable environmental conditions. These objectives are designed to be used with a 180mm focal length tube lens and are available in magnification of 10 – 50X. Olympus WLI Infinity Corrected Interferometry Objectives are ideal for 3D surface metrology and profilometry applications, including semiconductor inspection, precision machining, optical coating evaluation, and microelectronic characterization.